You signed in with another tab or window. Reload to refresh your session.You signed out in another tab or window. Reload to refresh your session.You switched accounts on another tab or window. Reload to refresh your session.Dismiss alert
Given curves from datasheet typically have a small failure in switching losses Eon and Eoff. One of the curve has too much energy, the otherone to low energy. The difference is the energy stored in the output capacitance.
In hard switching converters, this failure does not matter, because energy of both switching processes is converted to losses.
Resonant topologies this difference matters, because one switching event is neglected through the soft switching. So e.g. the off losses are still there, but does not macht to reality.
May it is possible to provide a function which corrects these loss curves
The text was updated successfully, but these errors were encountered:
It is planned to do this from datasheet parameters. The chip manufacturer usually performs a double-puls-test, without correcting the energy what is stored in Coss to the loss energies. So, Eon is measured too small, and Eoff is measured so high.
From Coss curve, and the current DC-link voltage, the energy stored in Coss can be calculated
This constant loss is substracted from Eoff and added to Eon
Given curves from datasheet typically have a small failure in switching losses Eon and Eoff. One of the curve has too much energy, the otherone to low energy. The difference is the energy stored in the output capacitance.
In hard switching converters, this failure does not matter, because energy of both switching processes is converted to losses.
Resonant topologies this difference matters, because one switching event is neglected through the soft switching. So e.g. the off losses are still there, but does not macht to reality.
May it is possible to provide a function which corrects these loss curves
The text was updated successfully, but these errors were encountered: